Many digital-communications systems use non-return-to-zero (NRZ) signaling, and system designers have created many NRZ test patterns to test and verify their products. These patterns usually either ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...